Please use this identifier to cite or link to this item:
http://arks.princeton.edu/ark:/88435/dsp01w9505358d
Title: | Probe measurements of electric field and electron density fluctuations at megahertz frequencies using in-shaft miniature circuits |
Contributors: | Yoo, Jongsoo Yibo, Hu Yoo, Jongsoo Ji, Hantao Goodman, Aaron Wu, Xuemei U. S. Department of Energy contract number DE-AC02-09CH11466 National Natural Science Foundation of China (NNSFC) (Contract No. 11975163), the Priority Academic Program Development of Jiangsu Higher Education Institutions (PAPD) the Program for Graduates Research and Innovation in University of Jiangsu Province (Contract No. KYCX17-2025) |
Issue Date: | 16-Mar-2021 |
Publisher: | Princeton Plasma Physics Laboratory, Princeton University |
URI: | http://arks.princeton.edu/ark:/88435/dsp01w9505358d |
Referenced By: | https://doi.org/10.1063/5.0035135 |
Appears in Collections: | Plasma Science & Technology |
Files in This Item:
File | Description | Size | Format | |
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fig3.xlsx | 479.3 kB | Microsoft Excel XML | View/Download | |
fig4.xlsx | 11.52 kB | Microsoft Excel XML | View/Download | |
fig5.xlsx | 220.09 kB | Microsoft Excel XML | View/Download | |
readme.pdf | 56.56 kB | Adobe PDF | View/Download |
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