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Please use this identifier to cite or link to this item: http://arks.princeton.edu/ark:/88435/dsp01w9505358d
Title: Probe measurements of electric field and electron density fluctuations at megahertz frequencies using in-shaft miniature circuits
Contributors: Yoo, Jongsoo
Yibo, Hu
Yoo, Jongsoo
Ji, Hantao
Goodman, Aaron
Wu, Xuemei
U. S. Department of Energy contract number DE-AC02-09CH11466
National Natural Science Foundation of China (NNSFC) (Contract No. 11975163),
the Priority Academic Program Development of Jiangsu Higher Education Institutions (PAPD)
the Program for Graduates Research and Innovation in University of Jiangsu Province (Contract No. KYCX17-2025)
Issue Date: 16-Mar-2021
Publisher: Princeton Plasma Physics Laboratory, Princeton University
URI: http://arks.princeton.edu/ark:/88435/dsp01w9505358d
Appears in Collections:Plasma Science & Technology

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