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Please use this identifier to cite or link to this item: http://arks.princeton.edu/ark:/88435/dsp01m900nw488
Title: The Effects of Mechanical Strain on the Electrical Properties of Thin-Film Transistors
Authors: Hopp, Wayne, III
Advisors: Wagner, Sigurd
Department: Electrical Engineering
Class Year: 2006
Extent: 27 Pages
Format: Contains color or special media
Other Identifiers: 19480
URI: http://arks.princeton.edu/ark:/88435/dsp01m900nw488
Location : This thesis can be viewed in person at the Mudd Manuscript Library. To order a copy complete the Senior Thesis Request Form. For more information contact mudd@princeton.edu.
Type of Material: Princeton University Senior Theses
Appears in Collections:Electrical and Computer Engineering, 1932-2023

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