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Title: High-Frequency Capacitance Measurement of Metal-Oxide-Semiconductor Capacitors
Authors: Nayak, Jawahar
Advisors: Sturm, James
Department: Electrical Engineering
Class Year: 1989
Extent: 21 Pages
Other Identifiers: 6715
Location : This thesis can be viewed in person at the Mudd Manuscript Library. To order a copy complete the Senior Thesis Request Form. For more information contact
Type of Material: Princeton University Senior Theses
Appears in Collections:Electrical Engineering, 1932-2020

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