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Please use this identifier to cite or link to this item: http://arks.princeton.edu/ark:/88435/dsp01ww72bd56r
Title: The Art of Atomic Force Microscopy Tips and Techniques to use the Technology to Obtain Accurate Images. A Qualitative Description of the Technology
Authors: Kace, Jason
Advisors: Kahn, Antoine
Department: Electrical Engineering
Class Year: 2002
Extent: 20 Pages
Other Identifiers: 15800
URI: http://arks.princeton.edu/ark:/88435/dsp01ww72bd56r
Location : This thesis can be viewed in person at the Mudd Manuscript Library. To order a copy complete the Senior Thesis Request Form. For more information contact mudd@princeton.edu.
Type of Material: Princeton University Senior Theses
Appears in Collections:Electrical Engineering, 1932-2016

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