Please use this identifier to cite or link to this item:
http://arks.princeton.edu/ark:/88435/dsp01wm117r04j| Title: | The Generation and Annealing of Light-Induced Defects in Amorphous Silicon-Germanium Alloys The Kinetics of Thermally-Reversible Light-Induced Defect Generation in Hydrogenated and Fluorinated Amorphous Silicon-Germanium Alloys |
| Authors: | Shepard, Kenneth Lyle |
| Department: | Electrical Engineering |
| Class Year: | 1987 |
| Extent: | 70 Pages |
| Other Identifiers: | 3230 |
| URI: | http://arks.princeton.edu/ark:/88435/dsp01wm117r04j |
| Location : | This thesis can be viewed in person at the Mudd Manuscript Library. To order a copy complete the Senior Thesis Request Form. For more information contact mudd@princeton.edu. |
| Type of Material: | Princeton University Senior Theses |
| Appears in Collections: | Electrical and Computer Engineering, 1932-2023 |
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