Please use this identifier to cite or link to this item:
|Title:||The Generation and Annealing of Light-Induced Defects in Amorphous Silicon-Germanium Alloys The Kinetics of Thermally-Reversible Light-Induced Defect Generation in Hydrogenated and Fluorinated Amorphous Silicon-Germanium Alloys|
|Authors:||Shepard, Kenneth Lyle|
|Type of Material:||Princeton University Senior Theses|
|Appears in Collections:||Electrical Engineering, 1932-2016|
Files in This Item:
There are no files associated with this item.
Items in Dataspace are protected by copyright, with all rights reserved, unless otherwise indicated.