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Please use this identifier to cite or link to this item: http://arks.princeton.edu/ark:/88435/dsp01wm117r04j
Title: The Generation and Annealing of Light-Induced Defects in Amorphous Silicon-Germanium Alloys The Kinetics of Thermally-Reversible Light-Induced Defect Generation in Hydrogenated and Fluorinated Amorphous Silicon-Germanium Alloys
Authors: Shepard, Kenneth Lyle
Department: Electrical Engineering
Class Year: 1987
Extent: 70 Pages
Other Identifiers: 3230
URI: http://arks.princeton.edu/ark:/88435/dsp01wm117r04j
Location : This thesis can be viewed in person at the Mudd Manuscript Library. To order a copy complete the Senior Thesis Request Form. For more information contact mudd@princeton.edu.
Type of Material: Princeton University Senior Theses
Appears in Collections:Electrical Engineering, 1932-2016

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