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|Title:||Measuring the Optical Absorption of Silicon to Infer Temperature: Further Experiments with Heavily Doped Thin Layers and Metallized Wafers|
|Authors:||Miller, John C.|
|Advisors:||Sturm, James C.|
|Type of Material:||Princeton University Senior Theses|
|Appears in Collections:||Electrical Engineering, 1932-2017|
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