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Please use this identifier to cite or link to this item: http://arks.princeton.edu/ark:/88435/dsp01tx31qk736
Title: Measuring the Optical Absorption of Silicon to Infer Temperature: Further Experiments with Heavily Doped Thin Layers and Metallized Wafers
Authors: Miller, John C.
Advisors: Sturm, James C.
Department: Electrical Engineering
Class Year: 1992
Other Identifiers: 6853
URI: http://arks.princeton.edu/ark:/88435/dsp01tx31qk736
Location : This thesis can be viewed in person at the Mudd Manuscript Library. To order a copy complete the Senior Thesis Request Form. For more information contact mudd@princeton.edu.
Type of Material: Princeton University Senior Theses
Appears in Collections:Electrical Engineering, 1932-2016

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