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|Title:||Measuring the Optical Absorption of Silicon to Infer Temperature: Further Experiments with Heavily Doped Thin Layers and Metallized Wafers|
|Authors:||Miller, John C.|
|Advisors:||Sturm, James C.|
|Location :||This thesis can be viewed in person at the Mudd Manuscript Library. To order a copy complete the Senior Thesis Request Form. For more information contact firstname.lastname@example.org.|
|Type of Material:||Princeton University Senior Theses|
|Appears in Collections:||Electrical Engineering, 1932-2016|
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