Skip navigation
Please use this identifier to cite or link to this item: http://arks.princeton.edu/ark:/88435/dsp01m039k7336
Title: Discovering Similarities in Relief Patterns of Taranto Coins
Authors: Juang, Jean
Advisors: Ramadge, Peter
Contributors: Rusinkiewicz, Szymon
Department: Electrical Engineering
Class Year: 2016
Abstract: Die study, the comparison of coin reliefs to determine which coins were struck from the same die, is an important but time consuming task for numismatists. In this paper, we build a pipeline for automatic classification of normal maps of coin reliefs, consisting of a simple image registration algorithm and a Support Vector Machine classifier, and show ways to detect defects in coins given these classifications. Using the distribution of distances between edge pixels, we achieve a classification accuracy of 99.4% for a subset of coins, and 85.5% for the entire dataset. For defects, we show that we are able to detect cracks in the coins by comparing the gradients of pixels to neighboring pixels. We model a hammerstrike defect with a secondorder radial expansion and find that the effects of expansion are minimal, on the order of micrometers for a 12mmradius coin.
Extent: 36 pages
URI: http://arks.princeton.edu/ark:/88435/dsp01m039k7336
Type of Material: Princeton University Senior Theses
Language: en_US
Appears in Collections:Electrical Engineering, 1932-2016

Files in This Item:
File SizeFormat 
Juang_Jean_seniorthesis.pdf1.8 MBAdobe PDF    Request a copy


Items in Dataspace are protected by copyright, with all rights reserved, unless otherwise indicated.