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Please use this identifier to cite or link to this item: http://arks.princeton.edu/ark:/88435/dsp01g732dc04f
Title: Non-Destructive Methods to Measure the Refractive Index and Thickness of Thin Films of SiGe Grown on Si Substrates
Authors: Lee, Sherry F.
Department: Electrical Engineering
Class Year: 1989
Extent: 18 Pages
Other Identifiers: 3215
URI: http://arks.princeton.edu/ark:/88435/dsp01g732dc04f
Location : This thesis can be viewed in person at the Mudd Manuscript Library. To order a copy complete the Senior Thesis Request Form. For more information contact mudd@princeton.edu.
Type of Material: Princeton University Senior Theses
Appears in Collections:Electrical Engineering, 1932-2016

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