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http://arks.princeton.edu/ark:/88435/dsp01g732dc04f| Title: | Non-Destructive Methods to Measure the Refractive Index and Thickness of Thin Films of SiGe Grown on Si Substrates |
| Authors: | Lee, Sherry F. |
| Department: | Electrical Engineering |
| Class Year: | 1989 |
| Extent: | 18 Pages |
| Other Identifiers: | 3215 |
| URI: | http://arks.princeton.edu/ark:/88435/dsp01g732dc04f |
| Location : | This thesis can be viewed in person at the Mudd Manuscript Library. To order a copy complete the Senior Thesis Request Form. For more information contact mudd@princeton.edu. |
| Type of Material: | Princeton University Senior Theses |
| Appears in Collections: | Electrical and Computer Engineering, 1932-2023 |
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