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Title: Exploiting Secuity Holes in Modern RFID Systems: A Study of Vulnerabilities in ISO15693
Authors: Norair, John
Advisors: Lerch, John
Department: Electrical Engineering
Class Year: 2004
Extent: 14 Pages
Format: Contains color or special media
Other Identifiers: 17758
Location : This thesis can be viewed in person at the Mudd Manuscript Library. To order a copy complete the Senior Thesis Request Form. For more information contact
Type of Material: Princeton University Senior Theses
Appears in Collections:Electrical Engineering, 1932-2017

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