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Please use this identifier to cite or link to this item: http://arks.princeton.edu/ark:/88435/dsp010g354h24h
Title: Cyclic Mechanical Strain Effects on Thin Film Transistors on Kapton
Authors: Murakami, Hajime K.
Advisors: Wagner, Sigurd
Department: Electrical Engineering
Class Year: 2007
Extent: 72 Pages
Other Identifiers: 20644
URI: http://arks.princeton.edu/ark:/88435/dsp010g354h24h
Location : This thesis can be viewed in person at the Mudd Manuscript Library. To order a copy complete the Senior Thesis Request Form. For more information contact mudd@princeton.edu.
Type of Material: Princeton University Senior Theses
Appears in Collections:Electrical and Computer Engineering, 1932-2023

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